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Title
Test Case Generation for Context Testing of Embedded Systems
Author
Qi-Ping Yang, Tae-Hyong Kim
Vol. 7 No. 11 pp. 142-148
Keywords
Embedded System, Context Testing, Test Case Generation
Automatic Functional Verification of OPNET Models with SDL-OPNET Co-Simulation
Tae-Hyong Kim, Qi-Ping Yang, Jae-Woo Kim
Vol. 11 No. 5 pp. 145-151
Model-driven development, model verification, Performance evaluation, Co-simulation