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Title |
Use of Labview Software for Measuring the Change of Surface Potential of Thin Dielectric Layers |
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Author |
Justinas Jurk?us, Tadeu? Lozovski, Miroslav ?eibak, Germanas Budnikas |
| Citation |
Vol. 12 No. 12 pp. 115-120 |
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Keywords |
LabView, Real Time Monitoring and Control, Method of Dosed Charging |
