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Results for Gautam Das; Total 1

Title

System-on-Chip Test-time and Scan-power Minimization Integrating Core and Interconnect Testing

Author

Gautam Das, Santanu Chattopadhyay, Haripada Bhaumik
Citation

Vol. 9  No. 3  pp. 201-209

Keywords

SoC testing, Core, Interconnect test, Scan-power, Power optimization

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