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Title |
Test Design and Optimization for Multiple Core Systems-On-a-Chip using Genetic Algorithm |
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Author |
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| Citation |
Vol. 6 No. 10 pp. 121-129 |
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Keywords |
Integrated Circuit, Genetic Algorithm, System-on-Chip, Pre-Designed Core, Test Vector, Test Access Mechanism, Application Specific Integrated Circuit, Benchmark Circuit |
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Title |
Reusing Vehicular Control Networks as Test Access Mechanism for Automotive Semiconductor Chips |
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Author |
Muhammad Adil Ansari, Mohsin Khan Shaikh, Ahmed Ali & Saleem Ahmed |
| Citation |
Vol. 17 No. 12 pp. 188-192 |
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Keywords |
Controller area network, FlexRay, test access mechanism, scan test design, vehicular control networks. |
