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Results for integrated circuit measurements; Total 1

Title

An On-Chip Delay Measurement Technique for Small-Delay Defect Detection Using Signature Registers

Author

RAJESHWARI SOMA, ZULEKHA TABASSUM, S.PRATHAP
Citation

Vol. 14  No. 9  pp. 60-66

Keywords

Delay estimation, design for testability (DFT), integrated circuit measurements, semiconductor device reliability, signature register

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