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Title
Test Design and Optimization for Multiple Core Systems-On-a-Chip using Genetic Algorithm
Author
SAKTHIVEL, NARAYANASAMY
Vol. 6 No. 10 pp. 121-129
Keywords
Integrated Circuit, Genetic Algorithm, System-on-Chip, Pre-Designed Core, Test Vector, Test Access Mechanism, Application Specific Integrated Circuit, Benchmark Circuit
Power-Oriented Test Scheduling for SOCs
Wang-Dauh Tseng
Vol. 6 No. 11 pp. 102-106
SOC, test vector reordering, power consumption, test scheduling.