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Title |
Reusing Vehicular Control Networks as Test Access Mechanism for Automotive Semiconductor Chips |
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Author |
Muhammad Adil Ansari, Mohsin Khan Shaikh, Ahmed Ali & Saleem Ahmed |
| Citation |
Vol. 17 No. 12 pp. 188-192 |
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Keywords |
Controller area network, FlexRay, test access mechanism, scan test design, vehicular control networks. |
